Abstract
The broadband study of the insulators (Teflon, Bakelite, and Air) is done through simulations to determine the dielectric properties in the frequency range of 0.2–3 GHz by transmission/reflection technique. Nicolson-Rose-Weir (NRW) method is used to translate the scattering parameters; reflection (S11) and transmission (S21) into relative permittivity (εr) and relative permeability (μr). High-Frequency Structure Simulator (HFSS) is used to design sample and sample holder as a coaxial device. Also, the position of the sample and air gap corrections are estimated in HFSS. Computed results are comparable with the NIST standard values of three insulators. In the case of Teflon, the experimental procedure is adopted after employing optimization (for sample and sample holder) algorithm in HFSS to measure εr and μr. Simulation and experimental outcomes have a good convergence for the dielectric properties of Teflon.
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