Abstract
The use of INAA and IPAA is illustrated by several applications (Zn-traces in Cu, neutron doping of Zn in copper, implanted Sb in silicon, trace elements in sediment material and polyethylene). The two methods are used to complement or to cross-check each other. Validation by IDA-TIMS was performed in the case of neutron doping and turned out to be a valuable support. Even developed routines of activation analysis need improvement. Two technical solutions, the high energy photon screen (HEPS) and a twin detector assembly, are dealt with in detail.
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