Abstract

We propose a novel analysis method to obtain the core bright part of an electron beam with a complex phase-space profile. This method is beneficial to evaluate the performance of simulation data of a linear accelerator (linac), such as an x-ray free electron laser (XFEL) machine, since the phase-space distribution of a linac electron beam is not simple, compared to a Gaussian beam in a synchrotron. In this analysis, the brightness of undulator radiation is calculated and the core of an electron beam is determined by maximizing the brightness. We successfully extracted core electrons from a complex beam profile of XFEL simulation data, which was not expressed by a set of slice parameters. FEL simulations showed that the FEL intensity was well remained even after extracting the core part. Consequently, the FEL performance can be estimated by this analysis without time-consuming FEL simulations.

Highlights

  • Brilliant electron beams from linear accelerators are widely utilized for synchrotron radiation facilities etc., such as x-ray free electron lasers (XFEL) [1] and energy recovery linacs (ERL) [2]

  • For a self-amplified spontaneous emission (SASE) FEL, the FEL gain can be evaluated from the peak current, the slice emittance and the slice energy spread of an electron beam by using a simple model [3]

  • Since the phase-space distribution of an electron beam from a linear accelerator is not always a simple Gaussian shape, it is sometimes difficult to analyze the brightness of the electron beam

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Summary

INTRODUCTION

Brilliant electron beams from linear accelerators (linac) are widely utilized for synchrotron radiation facilities etc., such as x-ray free electron lasers (XFEL) [1] and energy recovery linacs (ERL) [2]. For a self-amplified spontaneous emission (SASE) FEL, the FEL gain can be evaluated from the peak current, the slice emittance and the slice energy spread of an electron beam by using a simple model [3] This simple model sometimes is not applicable to a real SASE-XFEL machine, when an electron beam profile is far from a simple Gaussian beam frequently seen in case of hard bunch. In order to efficiently design a high-performance SASE-FEL or another linac-based synchrotron radiation machine, it is critically important to evaluate effective slice parameters, such as a slice emittance, a slice energy spread and a peak current, which represent the bunch part contributing to SASE-FEL. This method is applied to a simulation data of the XFEL facility, SACLA [4] in order to verify the effectiveness of this method

BRIGHTNESS CALCULATION
Brightness of undulator radiation from a Gaussian electron beam
Contribution of a single electron to the radiation brightness
Brightness of undulator radiation from an arbitrary electron distribution
APPLICATION TO ELECTRON BEAM FOR XFEL
DISCUSSION
CONCLUSIONS
Result
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