Abstract
This paper reports recent efforts of the intersectoral iNEMI consortium towards bridging the traceability gap in the characterisation of dielectric materials used in 5G applications. Several GHz resonators, in SCR, SPDR, and FPOR topologies are applied to four samples fabricated from the same COP coupon. Characterisation is performed at three laboratories, using VNAs of different form-factors, and covering the frequency range of 10–110GHz. Excellent agreement is demonstrated between the methods and the samples. Consistent measurements at 10 GHz provide a trace to more conventional material measurements in the microwave range.
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