Abstract
This paper presents computer simulations and quantum mechanical calculations of the electronic energetic and structural characteristics of stable bridge-like radiation defects in few-layer graphene and some experimental results of study such irradiated by scanning electron microscope (30 and 15keV) electron beams. Results of examination of few-layer graphene specimens in the pre-irradiated and post-irradiated states by optical, electron microscopy, X-ray energy dispersive spectroscopy and Raman spectroscopy are given. A possible physical mechanism of under threshold energy structural defects production is proposed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
