Abstract
The analytic solution of the pseudo-Brewster angle, for the case of electromagnetic waves incident from a transparent optical material onto an absorbing material, has been obtained. We have developed a unique measurement method, called the pseudo-Brewster angle method, for obtaining the optical constants of thin films. By this method, the reflected intensity is measured at any angle of incidence. The optical constants are calculated from the pseudo-Brewster angle at the minimum value of the reflection coefficient. As a result, the pseudo-Brewster angle method is very useful for measuring the optical constants of a thin film.
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