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Abstract
Double-axis x-ray spectrometer measurements at flat, low-absorbing mosaic crystals produce broad and asymmetric Bragg-reflection profiles. If the absorption coefficient changes during the sample preparation process, as in the case of graphite and graphite intercalation compounds, a determination of the instrumental profile is almost impossible. Using triple-axis spectrometers, the Bragg-reflection profiles are independent of the sample transparency, and peak profiles can be determined with high resolution and minor corrections.
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