Abstract
Bragg deflection of waveguided light by SAW has been observed in an epitaxial PLZT thin film on sapphire structure. Thin film of PLZT was successfully grown with high transparency and piezoelectricity by rf magnetron sputtering. Present PLZT thin film will be one of the most promising candidates to make integrated optic devices using E–O and A–O properties.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
