Abstract
Abstract We consider the problem of synthesis of irredundant two-pole contact circuits which implement n-place Boolean functions and allow short single fault detection or diagnostic tests of closures of at most k contacts. We prove that the Shannon function of the length of a fault detection test is equal to n for any n and k, and that the Shannon function of the length of a diagnostic test is majorized by n + k(n − 2) for n ⩾ 2.
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