Abstract

Low-voltage, n-type organic field effect transistors (OFETs) with simultaneously modified bottom-contact (BC) electrodes and dielectric were compared to their top-contact (TC) counterparts. The devices modified with 6-phenoxyhexylphosphonic acid (Ph6PA) self-assembled monolayer (SAM) showed similar performance, morphology, and contact resistance. Electron mobility of C60 devices were 0.212 and 0.320cm2V−1 s−1 and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) devices were 0.04 and 0.06cm2V−1s−1 for TC and BC devices, respectively. Low contact resistance between 11 and 45kΩcm was found regardless of device architecture or n-type semiconductor used. This work shows it is possible to fabricate solution processable low-voltage bottom-contact devices with performance that is similar or better than their top-contact counterparts without the addition of complex and time-consuming processing steps.

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