Bootstrap confidence intervals of CNpk for exponentiated Fréchet distribution

Abstract

Confidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355–360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Frechet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples.