Abstract
With the latest advance in the non-volatile random-access memory (NVRAM), NVRAM is widely considered as the mainstream for the next-generation storage mediums. NVRAM has numerous attractive features, which include byte addressability, limited idle energy consumption, and great read/write access speed. However, owing to the high manufacturing cost of NVRAM, the incentive of deploying NVRAM in consumer electronics is lowered due to the consideration of profitability. To resolve the profitability issue and bring the benefits of NVRAM into the design of consumer electronics, avoiding storing duplicate data on NVRAM becomes a crucial task for lowering the demand and deployment cost of NVRAM. Such observation motivates us to propose a data deduplication extended file system design (DeEXT) to boost the profitability of NVRAM via the concept of dual-chunking data deduplication while considering the characteristics of NVRAM and duplicate data content. The proposed DeEXT was then evaluated by real-world data deduplication traces with encouraging results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
