Abstract
Biometrical JournalVolume 50, Issue 4 p. 627-627 Book Review Book Review: Statistical Analysis and Modelling of Spatial Point Patterns. By J. Illian, A. Penttinen, H. Stoyan, and D. Stoyan M. N. M. van Lieshout, Corresponding Author M. N. M. van Lieshout colette@cwi.nl CWI & Eindhoven University of Technology & EURANDOM, Kruislaan 413, 1098 SJ Amsterdam, The NetherlandsPhone: +31 20 592 4008, Fax: +31 20 592 4199Search for more papers by this author M. N. M. van Lieshout, Corresponding Author M. N. M. van Lieshout colette@cwi.nl CWI & Eindhoven University of Technology & EURANDOM, Kruislaan 413, 1098 SJ Amsterdam, The NetherlandsPhone: +31 20 592 4008, Fax: +31 20 592 4199Search for more papers by this author First published: 29 July 2008 https://doi.org/10.1002/bimj.200810435AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume50, Issue4August 2008Pages 627-627 RelatedInformation
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