Abstract
A Black Box Model for the quick complete characterization of the optical gain and amplified spontaneous emission noise in Semiconductor Optical Amplifiers is presented and verified experimentally. This model provides good accuracy, even neglecting third order terms in the spectral gain shift, and can provide cost reduction in SOA characterization and design as well as provide simple algorithms for hybrid integration in-package control.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
