BIST for Reconfigurable System on Chip (SOC) for Micro-Vibration Measurement

Abstract

This paper presents methodology for testing mixed signal circuits in the SOC configured for micro vibration measurement. The SOC for micro vibration measurement contains a Bi morph sensor and front end electronics containing an amplifier, peak detector interface with A/D converter and memory. The amplifier is tested by applying triangular stimuli input generated by Test Pattern Generator (TPG) configured in the FPGA. The peak detector is tested by applying a test pulses generated by test generator system. The outputs of the test circuit are analyzed by output response analyzer (ORA) in the FPGA. The required hardware for testing analog as well as digital circuits of the SOC are configured by the on chip portion of FPGA and FPAA. The whole SOC can be tested by applying stimuli generated in TPG and checking the output by comparing patterns stored in memory with reference pattern using ORA. Simulation results are reported for counter and test ADC.