Abstract
A bipolar-type one diode–one resistor (1D1R) memory device is proposed and demonstrated by integrating a Ni/TiO2/Ti diode and an Al/Strontium Titanate Nickelate (STN)/Pt bipolar resistive random access memory cell to suppress undesired sneak current in a cross-point array. Uniform self-compliance resistive-switching characteristics can be achieved by reverse bias current of the Ni/TiO2/Ti diode. Experimental results show that the bipolar 1D1R memory device has reproducible, uniform, and self-rectifying resistive-switching behavior in low-resistance state. High current ON/OFF ratio (>105) and satisfactory retention (>>105 s) are achieved. Therefore, the proposed device exhibits high potential for high-density integrated nonvolatile memory applications.
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