Abstract
Scale Invariant Feature Transform (SIFT) is used for local features description of images. The proposed technique employs SIFT in order to match binary images. While the employment of SIFT descriptors on binary image databases could be possible, its power is rather limited. The novelty of the proposed algorithm is make use of SIFT for binary image matching by taking the power of Hough Transform (HT) in line detection. HT can be used on any line orientation. Thus, HT investigates lines as criteria for binary image similarity beside SIFT features for local and corner descriptions. The evaluation is achieved and experimental highlights the superiority of this approach for binary images which contains straight lines.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
