Abstract
We have developed a dynamic atomic force microscopy (AFM) method based on thesimultaneous excitation of the first two flexural modes of the cantilever. Theinstrument, called a bimodal atomic force microscope, allows us to resolve thestructural components of antibodies in both monomer and pentameric forms.The instrument operates in both high and low quality factor environments, i.e.,air and liquids. We show that under the same experimental conditions, bimodalAFM is more sensitive to compositional changes than amplitude modulationAFM. By using theoretical and numerical methods, we study the material contrastsensitivity as well as the forces applied on the sample during bimodal AFM operation.
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