Abstract
This paper deals with optimal design of time-censored step-stress partially accelerated life test sampling plan (PALTSP) using Burr type-XII life distribution. The Burr type XII distribution has been found appropriate for modeling failures that occur with less frequency and also when there is high occurrence of early failures. This distribution has been found appropriate for accelerated life testing experiments. The optimum sampling plan obtained using bilevel programming approach consists in finding optimum sample size and optimum stress change point by minimizing expected total cost per lot comprising warranty costs with respect to acceptance or rejection of the lot, sampling cost and testing cost such that the producer's and consumer's interested are safeguarded. The methods developed has been illustrated using an example and sensitivity analyses carried out.
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