Abstract
Abstract During epitaxial growth of Fe on Cu(100) the normalized Auger signal of Fe was taken as a function of evaporation time. This curve shows evidence for a layer-by-layer growth mode and clearly rules out other possible growth modes. Rutherford backscattering spectrometry was used to determine thicknesses of a one- and two-layer film quantitatively with an accuracy of ± 0.3 ML. These data together with the Auger analysis unveil a bilayer-by-bilayer growth mode for the first two bilayers.
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