Abstract

NIM (National Institute of Metrology, China) and NMIA (National Measurement Institute, Australia) carried out a comparison program, which included low-voltage capacitance, the voltage dependence of high-voltage capacitance and the dielectric dissipation factor (DDF) at 50 Hz. The travelling standards included a low-voltage standard capacitor, a dissipation factor standard and a 100 kV compressed-gas capacitor. The capacitance and DDF of the standard capacitor, measured by the two institutes, agreed within 2 μF/F and 2×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-6</sup> , respectively, at 50 Hz and 500 V. DDF measurements at nominal values of 0.00000, 0.0001 and 0.001 agreed within 6×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-6</sup> at 50 Hz and 10 kV. The capacitance change of a 100 kV compressed-gas capacitor measured by the two institutes agreed within 2 μF/F over the voltage range from 10 kV to 100 kV. The success of the program proved comparisons using a re-filled high-voltage compressed gas capacitor and a low-voltage standard capacitor can be conveniently used to validate the complete traceability chain of the measurement of high-voltage capacitance at 50 Hz. The program also proved that DDF measurements with different implementations of traceability chain via capacitance and resistance would agree well within the uncertainties required by industrial measurements and a commercial DDF standard that has undergone international air travel would be sufficiently stable.

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