Biaxially aligned template films fabricated by inclined-substrate deposition for YBCO-coated conductor applications

Abstract

Inclined substrate deposition (ISD) has the potential for rapid production of high-quality biaxially textured buffer layers, which are important for YBCO-coated conductor applications. We have grown biaxially textured MgO films by ISD at deposition rates of 20 - 100 /spl Aring//sec. Columnar grains with a roof-tile surface structure were observed in the ISD-MgO films. X-ray pole figure analysis revealed that the [002] planes of the ISD-MgO films are tilted at an angle from the substrate normal. A small /spl phi/-scan full-width at half maximum (FWHM) of /spl ap/ 9/spl deg/ was observed on MgO films deposited at an inclination angle of 55/spl deg/. In-plane texture in the ISD MgO films developed in the first 0.5 /spl mu/m from the interface, then stabilized with further increases in film thickness. YBCO films deposited by pulsed laser deposition on ISD-MgO-buffered Hastelloy C276 substrates were biaxially aligned with the c-axis parallel to the substrate normal. T/sub c/ of 91 K with a sharp transition and transport J/sub c/ of 5.5 /spl times/ 10/sup 5/ A/cm/sup 2/ at 77 K in self-field were measured on a YBCO film that was 0.46-/spl mu/m thick, 4-mm wide, 10-mm long.