Abstract
A method of “biased referencing”, involving the use of an electron flood gun and an internal reference such as a metal dot, is investigated for the XPS analysis of non-conducting materials. Methods of Cu, Au and Pt dot referencing are used for silica, copper and zeolite substrate materials, from which binding energy measurements accurate to ±0.1 eV can be obtained. Such binding energy values are not independent of the work function of the measured materials, such that vacuum level alignment rather than Fermi level alignment appears to be induced by the action of the electron flood gun.
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