Abstract

Recent advances in nanoscale optoelectronic Ge devices have exposed their enormous potential for highly sensitive visible and near-infrared CMOS compatible photodetectors. In this respect, Ge nanowires, due to their nanocylinder resonator shape, have established themselves as a promising platform to significantly enhance the performance of photodetectors. Here, we present a highly sensitive polarity switchable Ge nanowire photodetector embedded in a monolithic and single-crystalline metal–semiconductor nanowire heterostructure. Operated in the negative differential resistance regime, effective dark current suppression up to a factor of 100 is achieved. In this configuration, a bias-switchable positive and negative photoconductance is observed and systematically analyzed. Further, a remarkably strong polarization anisotropy with a maximum TM/TE ratio of 33 was found for positive photoconductance. Most notably, presenting a Ge-based photodetector combining switchable photoconductance and effective dark current suppression may pave the way for advanced applications, including highly resolved imaging and light effect transistors.

Highlights

  • Recent advances in nanoscale optoelectronic Ge devices have exposed their enormous potential for highly sensitive visible and near-infrared CMOS compatible photodetectors

  • We demonstrate a highly sensitive Ge NW photodetector with switchable photoconductance, effective dark current suppression, and polarization sensitivity

  • Operation (Figure 2): While the negative photoconductance (NPC) is a result of the photogating effect, that is, excited electrons are efficiently trapped, acting as negative local gate, the valley region of the negative differential resistance (NDR) enables a significant drop of IDark, below the current under illumination resulting in a positive photoconductance (PPC)

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Summary

Introduction

Recent advances in nanoscale optoelectronic Ge devices have exposed their enormous potential for highly sensitive visible and near-infrared CMOS compatible photodetectors. To probe the dark-characteristic of our Al−Ge−Al-based photodetector, we applied a bias to the highly p-doped Si substrate, operating the device as a back-gated field-effect transistor (FET).

Results
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