Abstract
This paper describes the electrically observed failure behavior, dependence of the mean time to failure (MTTF) on the replicator-annihilator current pulse parameters, such as amplitudes, timings and durations, and qualitative failure analysis for 16 kbit major-minor chip. The control pulse parameters are adjusted to provide the longest MTTF near the bias field margin threshold where the MTTF is the most effective factor for data longevity, as pointed out by Shumate et al.1) The bias field margin degradation of the -0.2 Oe/decade is obtained. All the control function parameters are adjusted to provide the longest MTTF. Error-free memory operations in excess of 60 days and an error rate of less than 7×10-12/read were demonstrated for both start-stop and sequential read-restored test.
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