Abstract
Small perturbation techniques have proven to be useful tools for the investigation of perovskite solar cells. A correct interpretation of the spectra given by impedance spectroscopy (IS), intensity-modulated photocurrent spectroscopy (IMPS), and intensity-modulated photovoltage spectroscopy (IMVS) is key for the understanding of device operation. The utilization of a correct equivalent circuit to extract real parameters is essential to make this good interpretation. In this work, we present an equivalent circuit, which is able to reproduce the general and the exotic behaviors found in impedance spectra. From the measurements, we demonstrate that the midfrequency features that may appear to depend on the active layer thickness, and we also prove the spectral correlation of the three techniques that has been suggested theoretically.
Highlights
Small perturbation techniques have proven to be useful tools for the investigation of perovskite solar cells
The search for an appropriate equivalent circuit (EC) has been an aim among the perovskite community in the past years,[1−5] given the fact that a suitable EC would allow the extraction of important parameters of the operation of perovskite solar cells
Another important feature to take into account in impedance spectroscopy (IS) spectra is the negative capacitance.[9−12] This feature has been reported in a variety of publications, and its meaning is still under debate.[5,13−15] It usually appears in the lowest-frequency region of the spectra, and it shows up under different conditions, which makes it more complex to interpret
Summary
Small perturbation techniques have proven to be useful tools for the investigation of perovskite solar cells. The aim of this paper is to describe joint experimental measurements of IS, IMPS, and intensity-modulated photovoltage spectroscopy (IMVS) in carbon-based perovskite solar cells with IS spectra that include negative capacitance features under open circuit conditions.
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