Abstract
This paper describes in detail two microtomy techniques by which sections having beveled edges are cut. One method produces free, unsupported bevels; evidence presented in this paper demonstrates that these thin to approximately 50Å. The second method produces bevels which thin to infinite thinness: these are, however, supported by a full section thickness of epoxy resin. Bright-field and dark-field images of beveled sections are presented. The potential for high resolution electron microscopy in these sections is demonstrated and discussed.
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