Better approximation for the precision of the number of counts in the histogram test of ADCs

Abstract

Here one proposes a new analytical expression that can be used to estimate the precision of the estimates made with the histogram test of analog-to-digital converters as a function of the additive noise standard deviation present in the test setup. This can be advantageously used to determine the minimum samples that should be acquired in order to achieve a certain level of precision on the estimates made. A more rigorous choice of the number of samples makes the characterization more efficient and less time consuming.