Abstract
The secondary electron yield of an aluminum surface was measured in a vacuum of 10−4 tor. It depends on the time for which the surface has been exposed to the primary electron beam and decreases from the value corresponding to a clean aluminum surface to that of the polymerized hydrocarbon layer formed under electron bombardment in poor vacuum. After the yield had decreased to a constant value, the measurement was interrupted and the thickness of the polymerized layer was determined. From the descent of the yield curve, a mean path of the secondary electrons in the polymerized hydrocarbon layer could be estimated to be $$\lambda = 95 \pm 20{\AA}.$$
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