Abstract
Bending strain dependence of critical current, I c, of Ag/Bi-2223 57 filament tapes was investigated at 77 K and room temperature, RT, using a device invented by Goldacker. The strain where I c start to degrade steeply at 77 K, 0.48%, was larger than that at RT, 0.36%. This is an indication of an additional pre-compression in filaments to be bent at 77 K compared with that at RT. According to the voltage measurements using multiple taps in the longitudinal direction, the I c degradation behaviors at both temperatures varied depending on the section in the tape, due presumably to the difference in the crack propagation characteristics associated with the non-uniformity of the micro-structure. The onset strain for I c degradation was more precisely determined. The degradation characteristics were shifted to the smaller strain in the present result as compared with that obtained by bending tests using G10 sample holders of different bending radius. The difference can be explained by the different thermal history on setting specimens to the holder and the constraints during cooling. The repeated bending tests at 77 K showed that the discrimination between the gradual and steep degradation stages was clear and the degradation was controlled by both the maximum strain and the strain range.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.