Abstract
Diagnostics of intense particle beams require the development of new non-destructive beam monitoring methods. The development of a profile monitor based on beam induced fluorescence is described in this paper. Beam profile measurements under various residual gas pressure conditions and particle energies performed at the synchrotron COSY-Juelich,Germany and at the cyclotron beam transfer line at iThemba LABS,South Africa are presented and the pros and cons of the applied method is discussed.
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