Beam Manipulating via an Array of Nanoslits Modified by Perpendicular Cuts and Bumps

Abstract

We report the observation of focusing and deflection phenomena by employing a novel technique to perform phase front profile design in nanoslit-based planar plasmonic lenses and beam deflectors. Introducing perpendicular cuts and bumps to the perforated nanoslits on a thin metallic film is utilized to change the effective depth of the nanoslits which provide the possibility of manipulating the phase front profile based on the propagation property of the surface plasmon polaritons in the metal–insulator–metal waveguides. Using the dispersive finite-difference time-domain numerical method, simulations are conducted to explore the beam focusing and deflection phenomena, and the performance parameters of the lens and beam deflector include the focal length, full-width half-maximum, depth of focus, the efficiency of focusing, and the deflection angle. The whole structure is formed on a planar thin film which is convenient for miniaturization and high density integration besides that it can be fabricated by well-known techniques such as focused ion beam milling.