Abstract
The high levels of flux available at a fourth-generation synchrotron are shown to have significant beam heating effects for high-energy X-rays and radiation hard samples, leading to temperature increases of over 400 K with a monochromatic beam. These effects have been investigated at the ID11 beamline at the recently upgraded ESRF Extremely Brilliant Source, using thermal lattice expansion to perform in situ measurements of beam heating. Results showed significant increases in temperature for metal and ceria samples, which are compared with a lumped thermodynamic model, providing a tool for estimating beam heating effects. These temperature increases may have a drastic effect on samples and measurements, such as the rapid recrystallization of a copper wire shown here. These results demonstrate the importance of beam heating and provide information needed to consider, predict and mitigate these effects.
Highlights
Fourth-generation synchrotron X-ray sources bring increasing levels of flux and coherence, allowing unprecedented levels of resolution for a wide range of techniques, but with increasing risk of radiation damage
The high flux achievable at synchrotrons has been well known to cause damage in biological samples at around 5–20 keV (Ravelli & Garman, 2006; Garman, 2010; Garman & Weik, 2019); with increasing flux we have found that radiation effects become significant even for metal samples and high-energy X-rays through beam heating
With the Extremely Brilliant Source upgrade at the European Synchrotron Radiation Facility (ESRF-EBS), we show that a monochromatic 43.44 keV beam can cause temperature increases as large as 400 K
Summary
Fourth-generation synchrotron X-ray sources bring increasing levels of flux and coherence, allowing unprecedented levels of resolution for a wide range of techniques, but with increasing risk of radiation damage. With the Extremely Brilliant Source upgrade at the European Synchrotron Radiation Facility (ESRF-EBS), we show that a monochromatic 43.44 keV beam can cause temperature increases as large as 400 K. These significant increases in sample temperature may change sample properties such as lattice parameters and drive significant chemical or physical changes. If the materials being measured are used as standards, temperature can play a significant role in the accuracy of measurements These factors make X-ray beam heating a potential issue for all samples
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