Abstract
The increasingly high reliability requirements being imposed on complex computing systems cause conventional reliability demonstration tests to be prohibitively long and costly. As a consequence, combined analytical/demonstration test techniques are very attractive. This paper develops procedures for system reliability demonstration based on Bayesian approaches. A general discussion of Bayesian techniques is provided. A methodology for incorporating all relevant data (including, perhaps, data obtained from other related systems or subsystems) into a system or operational-mode reliability analysis for the constant-hazard-rate, series system case is developed.
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