Abstract

An efficient method for finding a better maximizer of computationally extensive probability distributions is proposed on the basis of a Bayesian optimization technique. A key idea of the proposed method is to use extreme values of acquisition functions by Gaussian processes for the next training phase, which should be located near a local maximum or a global maximum of the probability distribution. Our Bayesian optimization technique is applied to the posterior distribution in the effective physical model estimation, which is a computationally extensive probability distribution. Even when the number of sampling points on the posterior distributions is fixed to be small, the Bayesian optimization provides a better maximizer of the posterior distributions in comparison to those by the random search method, the steepest descent method, or the Monte Carlo method. Furthermore, the Bayesian optimization improves the results efficiently by combining the steepest descent method and thus it is a powerful tool to search for a better maximizer of computationally extensive probability distributions.

Highlights

  • Bayesian optimization [1,2,3,4,5] has recently attracted much attention as a method to search the maximizer/minimizer of a black-box function in informatics and materials science [6,7,8,9,10,11,12]

  • We demonstrate an application for posterior distribution in effective physical model estimation based on a classical Ising model in two dimensions

  • We searched for a better maximizer of a posterior distribution in the effective physical model estimation which is a computationally extensive probability distribution, using the Bayesian optimization

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Summary

Introduction

Bayesian optimization [1,2,3,4,5] has recently attracted much attention as a method to search the maximizer/minimizer of a black-box function in informatics and materials science [6,7,8,9,10,11,12]. The minimum values of EC(x) obtained by the random search method, the steepest descent method, the Monte Carlo method, and the our Bayesian optimization are compared, depending on the number of sampling points Ns on EC(x).

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