Bayesian Cross-matching of High Proper-motion Stars in Gaia DR2 and Photometric Metallicities for ∼1.7 million K and M Dwarfs

Abstract

Abstract We present a Bayesian method to cross-match 5,827,988 high proper-motion Gaia sources (μ > 40 mas yr−1) to various photometric surveys: Two Micron All Sky Survey, AllWISE data release from the Wide-field Infrared Explorer (WISE) mission, Galaxy Evolution Explorer, Radial Velocity Experiment, Sloan Digital Sky Survey, and Panoramic Survey Telescope and Rapid Response System (Pan-STARRS). To efficiently associate these objects across catalogs, we develop a technique that compares the multidimensional distribution of all sources in the vicinity of each Gaia star to a reference distribution of random field stars obtained by extracting all sources in a region on the sky displaced 2′. This offset preserves the local field stellar density and magnitude distribution, allowing us to characterize the frequency of chance alignments. The resulting catalog with Bayesian probabilities >95% has a marginally higher match rate than current internal Gaia data release 2 (DR2) matches for most catalogs. However, a significant improvement is found with Pan-STARRS, where ∼99.8% of the sample within the Pan-STARRS footprint is recovered, as compared to a low ∼20.8% in Gaia DR2. Using these results, we train a Gaussian process regressor to calibrate two photometric metallicity relationships. For dwarfs of 3500 < T eff < 5280 K, we use metallicity values of 4378 stars from the Apache Point Observatory Galactic Evolution Experiment and Hejazi et al. to calibrate the relationship, producing results with a 1σ precision of 0.12 dex and few systematic errors. We then indirectly infer the metallicity of 4018 stars with 2850 < T eff < 3500 K, which are wide companions of primaries whose metallicities are estimated with our first regressor, to produce a relationship with a 1σ precision of 0.21 dex and significant systematic errors. Additional work is needed to better remove unresolved binaries from this second sample to reduce these systematic errors.