Abstract
Bayesian confidence limits for the availability of systems : W. E. Thompson and P. A. Palicio. IEEE Trans. Reliab.R-24, 118 (1975)
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https://doi.org/10.1016/0026-2714(76)90040-8
Copy DOIJournal: Microelectronics Reliability | Publication Date: Jan 1, 1976 |
Bayesian confidence limits for the availability of systems : W. E. Thompson and P. A. Palicio. IEEE Trans. Reliab.R-24, 118 (1975)
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