Abstract
The Failure process is usually quite complex and is often difficult to understand the physics of underlying process. It is even more difficult to mathematically describe such a process. Consequently a failure distribution is used to provide a statistical summary account of the length of life of a device and choice of distribution is largely an art. The main objective of the paper is to discuss about the use and importance of the Hazard rate function in real world. Then we obtain the Approximate Bayes estimate of the Hazard rate function of, Generalized Compound Rayleigh distribution (re-parameterized) in complete sample case under the squared error loss function and general entropy loss function through the Lindley approximation procedure. We also analyze the sensitivity of Approximate Bayes Estimate of model and presented a numerical study to illustrate the above technique on generated observations. The comparison is done by using R-programming.
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