Abstract

This paper presents a novel battery model parameterization method using actual field measurement and manufacturer datasheet for real-time hardware-in-the-loop (HIL) applications. It is critical that real-time HIL models can accurately reproduce field test results so that tests can be conducted on HIL testbeds instead of in the field. In the past, numerical heuristic optimization algorithms were often used to derive parameters for battery models. However, the deterministic algorithms often reach a locally optimal solution and stochastic heuristic searching strategies suffer from low searching efficiency. Therefore, in this paper, we propose a global-local searching enhanced genetic algorithm (GL-SEGA). By applying the generalized opposition-based learning mechanism, GL-SEGA can efficiently explore the global solution space. By using the trust-region-reflective method to perform the local search, the GL-SEGA can improve the accuracy and convergence in its local exploitations. Field measurements and manufactory datasheets are used to test and validate the accuracy and robustness of the GL-SEGA algorithm.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.