Basics, Possibilities and Limitations of the Microscopic X-Ray Fluorescence Analysis

Abstract

Microscopic X-ray fluorescence (MXRF) analysis was used to investigate different samples: meteorites, Jasper, coated glas and, reference materials. The element distribution within sections of two different meteorites have been determined – one metal rich and one oxide rich. The metal rich showed a matrix of Fe with Ni-, Ti-, and Si-enriched regions. The oxide rich also showed a Fe rich matrix and regions with different concentrations of other elements. A reference sample with a flat and polished but systematically tilted surface was used to assure, that roughness of the sections of the meteorites has only negligible influence. Nondestructive investigations in Jasper with included Stromatolithes, which were fossilized more than 2 billion years ago, showed the Stromatolithes to have Fe as main element instead of Si in the Jasper matrix. The thickness of Yb-layers on glas was determined from the intensity of the Yb fluorescence peak. Calibration was done by using a sample without coating and a reference sample whose thickness of the layer was determined by XRD reflectometry. Futhermore it has been shown that materials can be analysed even if mounted in glas capillaries or covered by plastic foils. By using Mark capillaries the elements from S to U may be detected instead of Na to U while working in vacuum mode.