Abstract
This paper describes a procedure that computes seeds for $LFSR$ -based generation of partially-functional broadside tests. Existing $LFSR$ -based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed $s_i$ in order to reduce the Hamming distance between the scan-in state $p_i$ that $s_i$ creates and a reachable state $r_j$ . When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault coverage.
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