Abstract

Using a scanning tunnelling microscope, the tunnelling currentvs. voltage is measured between a gold tip and the chemically etched (001) surface of YBa2Cu3Ox crystals at room temperature. The tunnelling barrier height and thickness are derived by modelling the system in the normal state as a conventional N-I-N junction. TheI(V) andG(V) curves are computed for the same junction in the superconducting state (N-I-S junction). The predicted gap structure for a single BCS-Dynes-like gap is simple and has low zero-bias conductance. The complexG(V) spectra measured belowTcon the etched junctions with ∼ 50% zero-bias conductance suggest a possible multilayer contribution in the unit cell.

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