Abstract

The effect of partial SiO2 substitution with Al2O3 and B2O3 on the thermal properties and crystallization of glass sealants in the (50 − x)SiO2–30BaO–20MgO–xAl2O3(B2O3) (wt %) system is studied. It is established that the coefficient of thermal expansion of all obtained glasses lies within a range of 8.2–9.9 × 10−6 K−1. Alumina-doped glasses crystallize after quenching, while samples containing boron oxide are completely amorphous. Magnesium silicates are formed in all glasses after exposure at 1000 °C for 125 h. After 500 h of exposure, a noticeable diffusion of zirconium ions is observed from the YSZ electrolyte to the glass sealant volume, resulting in the formation of the BaZrSi3O9 compound. The crystallization and products of interaction between YSZ ceramics and boron-containing sealants have no significant effects on the adhesion and properties of glass sealants, which makes them promising for applications in electrochemical devices.

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