Abstract

Barium ferrite thin films with perpendicular c-axis orientation and small grain size (about 300 Å) were successfully fabricated with careful control of sputtering conditions. The c-axis orientation of barium ferrite thin films is most sensitive to the oxygen partial pressure during deposition. All samples with oxygen gas during deposition have a random c-axis texture, as indicated by existence of both weak (00l) peaks and (106) peaks. All the samples without oxygen gas during deposition show only strong (00l) peaks, which indicate excellent perpendicular c-axis orientation. Transmission electron microscopy results show that oxygen gas promotes the growth of in-plane and/or randomly oriented grains. The effect of the Pt interlayer on the barium-rich films was also studied. The Pt interlayer was found to be very effective in improving c-axis orientation of barium-rich films. A relative increase in perpendicular nucleation sites over in-plane and/or random nucleation sites contributes to the improvement in perpendicular c-axis orientation.

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