Banding approach for engineered nanomaterial risk assessment and control

Abstract

Since there is a lack of sufficient toxicological information about engineered nanomaterials, and since within the semiconductor research and manufacturing use is already made of these materials, an alternative for the classical quantitative risk assessment was sought. Within the research facilities of imec use is made of a banding technique to determine the risks associated with the nanomaterial research. The method and the measures that are taken are discussed in the paper. The method has been benchmarked with other available techniques.