Abstract
Various morphologies of poly(trimethylene terephthalate) (PTT) solution-cast thin films at different crystallization temperatures were investigated by polarized light microscopy (PLM), atomic force microscopy (AFM) and transmitted electron microscopy (TEM). In the range of 110–150 °C, banded spherulite occurred and banding space gradually decreased along the radial direction from the primary nucleation site. Between 160 and 170 °C, normal non-banded spherulite was found. Above 170 °C, banded configuration occurred again. Lamellar growth direction of banded spherulite was determined to the crystal a-axis.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Wuhan University of Technology-Mater. Sci. Ed.
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
