Abstract
We show that four-terminal measurements of the differential conductance of field effect transistors (FETs) can provide important insights into the transport mechanism, and in particular can reveal the presence of ballistic transport. Measurements and simulations of purposely fabricated AlGaAs–GaAs heterostructure FETs show that ballistic transport results in a pronounced peak in the derivative of the differential conductance versus the gate voltage, which splits into two peaks with increasing drain-to-source voltage. Analyzing the four-probe conductance, ballistic electron transport through the channel is revealed as the origin of the observed peak splitting.
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