Abstract
A bakeable, ultrahigh-vacuum compatible, retractable four-point resistance probe has been constructed to make in situ measurements of superconductivity in ultrathin films. A bellows actuation mechanism allows the very compact contacting mechanism to be withdrawn from the substrate area for cleaning and characterization of the substrate surface, then returned for film resistance measurements. The device has been used to make contact to Pb films less than 10 Å thick deposited on high-resistivity Si substrates, which require a cleaning step that would be destructive to permanent or predeposited contacts.
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