Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification

Abstract

The present study considers identification of crystal plasticity parameters from knowledge of a deformed microstructure, backtracked to the reference state, and known kinematics along the sample surface. This theoretical analysis is applied to a numerical (synthetic) test case. A two-dimensional (2D) microstructure with one dimension along the depth is generated, then deformed using a known crystal plasticity law. A procedure is proposed to calibrate the constitutive parameters, addressing the specific challenge of partial knowledge of boundary conditions. The proposed identification strategy combined with estimation of the reference microstructure is shown to retrieve the constitutive parameters with good accuracy.