Abstract
It is demonstrated that Bragg reflection of XUV radiation can be used to study structural properties of crystalline materials with large unit cells. A standing-wave field is formed in a layered TiSe2 single crystal for a near-backscattering geometry (theta = 88.5 degrees). The partial electron yield is measured as a function of photon energy across the (001) Bragg reflection condition (hv approximately equal to 1033 eV) and its characteristic modulation is compared with the results derived from dynamical diffraction theory in the two-wave approximation. The data reveal a large amount of disorder along the c-axis.
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